Future Semiconductor Technology Laboratory

Professor

  Kim, Kyung Min

   Tel :  +82-42-350-3325
   E-mail :  km.kim@kaist.ac.kr
   Office :  Bldg. W1-1, Room #2403

  

 

Career

2017.11 ~ present     Associate Professor, Department of Materials Science and Engineering, KAIST, Daejeon, Korea

2014.01 ~ 2017.10    Research Scientist, System Research Lab, Hewlett Packard Labs, Hewlett Packard Enterprise, Palo Alto, California, USA

2013.02 ~ 2013.11    Senior Engineer, Advanced R&D P/J, Semiconductor R&D Center, Samsung Electronics, Hwaseong, Korea

2011.01 ~ 2013.02    Senior Engineer, Oxide Device Laboratory, Materials and Device Research Center, Samsung Advanced Institute of Technology (SAIT), Samsung Electronics, Giheung, Korea

2008.09 ~ 2011.01    Postdoctoral Researcher, Inter-university Semiconductor Research Center, Seoul National University, Seoul, Korea

 

 

Education

2003.09 ~ 2008.08    Integrated MA-Ph.D., Interdisciplinary Program in Nano-Science and Technology, College of Natrue Science, Seoul National University
[Thesis: A detailed model for the unipolar and bipolar resistive switching in TiO2 thin films]

1999.03 ~ 2003.02    B.S., Materials Science and Engineering, Seoul National University

 

Honors and Awards

2009.10   Do-yeon research award from the Inter-university Semiconductor Research Center (ISRC) of Seoul National University

2008.06   The best graduated student award from Department of Materials Science and Engineering in 2008

2008.02   The Samsung best presentation award from the 15th Korean Conference on Semiconductor
[Title: Bipolar resistance switching of Pt/TiO2/Pt structure]

2007.06   The best graduated student award from Department of Materials Science and Engineering in 2007

 

Recent Selected Publications

  ▸ Nature communications 9 (1), 417 (2018)

  ▸ Advanced Materials 30 (8), 1704320 (2018)

  ▸ Nano letters 16 (11), 6724-6732 (2016)

  ▸ Advanced Electronic Materials 2 (9), 1600090 (2016)

  ▸ Advanced Materials 28 (2), 356-362 (2016) 

  ▸ Advanced Materials 27 (25), 3811-3816 (2015)